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X-ray analysis equipment Product List and Ranking from 23 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

X-ray analysis equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  3. アワーズテック Osaka//Testing, Analysis and Measurement
  4. 4 ジャパンマシナリー Tokyo//Trading company/Wholesale
  5. 5 ソーキ Osaka//Service Industry
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X-ray analysis equipment Product ranking

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. Fluorescent X-ray measurement device 'X-RAY XDLM 237'
  2. Fluorescent X-ray measurement device FISCHERSCOPE X-RAY XDLM
  3. Portable X-ray Fluorescence Analyzer 'OURSTEX 170IIS' アワーズテック
  4. Fluorescent X-ray measuring instrument "XDL Series"
  5. ARL QUANT’X Energy Dispersive X-ray Fluorescence (XRF) Analyzer サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.

X-ray analysis equipment Product List

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ARL OPTIM'X Wavelength Dispersive X-ray Fluorescence (XRF) Analyzer

ARL OPTIM'X Wavelength Dispersive X-ray Fluorescence (XRF) Analyzer

Thermo Scientific ARL OPTIM'X WDXRF Analyzer - A versatile and high-precision elemental analysis solution.

The Thermo Scientific ARL OPTIM'X WDXRF is equipped with all the advantages of wavelength dispersive X-ray fluorescence analysis (WDXRF), making it ideal for elemental analysis of a wide variety of samples, whether solid or liquid. It offers four pre-set packages to meet the analytical needs of the petroleum, cement, and slag industries, as well as the diverse requirements of analytical laboratories, allowing for broad application across various fields. **Features** - High precision and reliable analytical performance - Analyzes a wide range of elements from carbon to uranium with high accuracy, precision, and reliability - Capable of analyses compliant with standard specifications such as ASTM and ISO - Significantly reduces the cost per analysis compared to traditional wet chemical methods and other spectroscopic techniques - Improved analytical efficiency through advanced technology - Innovative UCCO (Ultra Compact Coupled Optics) technology achieving up to 210% increase in intensity - Compact design of the SmartGonio device, optimal for sequential analysis - Optional Multichromator to enhance analysis speed and performance for selected elements - "Standard-less" analysis with the OptiQuant package allows for the analysis of up to 73 elements even in the absence of reference samples or with small, irregular samples.

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  • X-ray fluorescence analyzer
  • X-ray analysis equipment

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ARL PERFORM'X Wavelength Dispersive Fluorescence X-ray (XRF) Analysis Device

ARL PERFORM'X Wavelength Dispersive Fluorescence X-ray (XRF) Analysis Device

Thermo Scientific ARL XRF Series - A comprehensive material characterization solution to solve diverse analytical challenges.

The Thermo Scientific ARL PERFORM'X sequential fluorescent X-ray analysis system and the ARL X900 WDXRF analysis system are next-generation platforms that enable a multifaceted approach, from elemental analysis of solid and liquid samples to material property evaluation. These devices can analyze almost all elements with high precision, from beryllium (Be) to americium (Am), and are utilized in a wide range of fields, from industrial process management to academic research. **Core Technologies of the ARL PERFORM'X WDXRF Spectrophotometer** - Rapid analysis of unknown samples with integrated analytical functions - Sequential WDXRF analysis covering up to 90 elements - Inclusion analysis using micro spot beams of 0.5mm/1.5mm and elemental mapping with 0.1mm steps - Dual sample loading and a high-speed goniometer at 4800°/min, processing up to 60 samples per hour - Semi-quantitative analysis in three minutes using QuantAS software and standardless analysis up to Am (Z=95) using UniQuant software

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  • X-ray fluorescence analyzer
  • X-ray analysis equipment

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ARL QUANT’X Energy Dispersive X-ray Fluorescence (XRF) Analyzer

ARL QUANT’X Energy Dispersive X-ray Fluorescence (XRF) Analyzer

ARL QUANT'X EDXRF Analysis Device - High-performance benchtop XRF that accommodates a variety of samples.

The Thermo Scientific ARL QUANT'X EDXRF analysis device enables rapid and highly accurate quantitative analysis of a wide range of sample forms, from bulk solids, granules, and powders (loose or compressed) to fusion beads, thin films, pastes, and liquids, covering major elements to trace and ultra-trace elements. 【Features】 - Compact and high-performance benchtop design minimizes installation space while providing exceptional analytical accuracy and reliability. - Equipped with standardless software "UniQuant," allowing for accurate quantitative analysis even when unknown samples or reference materials are difficult to obtain. - Versatile sample chamber accommodating 10 to 20 positions, flexible enough to handle large samples. - Features high-performance silicon-lithium (Si(Li)) drift detectors and the latest generation SDD detectors, achieving excellent sensitivity and resolution from light to heavy elements. - Capable of analysis across a wide dynamic range from ppm levels to high concentrations. - Simple sample introduction and operation, ensuring rapid measurement and high throughput.

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  • X-ray fluorescence analyzer
  • X-ray analysis equipment

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ARL X900 Wavelength Dispersive X-ray Fluorescence (XRF) Analyzer

ARL X900 Wavelength Dispersive X-ray Fluorescence (XRF) Analyzer

ARL X900 WDXRF Analysis Device - A Robust Solution for Achieving Advanced Quality Control and Productivity

The Thermo Scientific ARL X900 WDXRF analyzer is a robust and reliable wavelength dispersive X-ray fluorescence (WDXRF) analysis device designed for production and process management in modern industries such as metals, cement, and mining. It also integrates XRD (X-ray diffraction) functionality, accommodating both elemental analysis and phase analysis.

  • Other physicochemical equipment
  • X-ray fluorescence analyzer
  • X-ray analysis equipment

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All-in-one fluorescent X-ray analysis device Zetium

All-in-one fluorescent X-ray analysis device Zetium

Equipped with both wavelength dispersive (WD) and energy dispersive (ED) core technologies in one device.

Integration of multiple X-ray technologies (WDX/EDX/XRD) into a single unit. Zetium achieves the integration of wavelength dispersive technology, capable of high-sensitivity analysis of light elements, and energy dispersive technology, suitable for high-speed analysis and micro-area analysis, into one platform. By simultaneously reading the optical system of WDX, which excels at light elements, and the optical system of EDX, which detects heavy elements with high resolution, it provides optimal measurement conditions that were difficult to achieve with conventional WDX-only devices. ● Covers a wide range of elements with up to five detectors - Gas flow detector (for light elements) - Hyperscintillation detector (for heavy elements) - Xe shield detector (for intermediate element high-sensitivity measurement) - Hyper-channel fixed detector (for specific elements) - SDD detector (for EDX measurement) ● From research and development in the lab to measurement automation in factories It supports measurement automation and offers suggestions for the device specifications and integration methods tailored to the condition of the customer's equipment. Flexibly responds to high precision, high-speed, and micro-area analysis needs with an optimal optical system. Additionally, with optional selections, quantification of free lime is also possible.

  • X-ray fluorescence analyzer
  • X-ray analysis equipment

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Desktop EDX device Epsilon 4

Desktop EDX device Epsilon 4

Achieve high-speed and accurate online elemental analysis! High-performance desktop energy-dispersive X-ray fluorescence analyzer.

Epsilon 4 is an energy-dispersive X-ray fluorescence (EDXRF) analyzer that improves measurement sensitivity compared to conventional devices. It is a multifunctional device that caters to various industries requiring elemental analysis from carbon (C) to americium (Am) under atmospheric or helium gas conditions in the fields of R&D and process management. The latest excitation/detection technology combined with advanced analytical software results in the analytical performance of the smartly designed Epsilon 4, which is comparable to powerful floor-standing XRF spectrometers. It is utilized in environmental analysis, cement, minerals, petroleum products, food, plastics, chemicals, liquids, and coatings. It comes equipped with Japanese software! 【Examples of Applications】 ● RoHS screening ● Screening of raw materials ● S, Ni, V in petroleum products ● Additive analysis in petrochemical products ● Soil analysis and extensive oxide analysis ● Identification of counterfeit materials ● Identification of metals ● Tribology analysis

  • Analytical Equipment and Devices
  • X-ray fluorescence analyzer
  • X-ray inspection equipment
  • X-ray analysis equipment

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Epsilon 1 Desktop Fluorescence X-ray Analyzer

Epsilon 1 Desktop Fluorescence X-ray Analyzer

Elemental analysis in a compact 40×40cm space: a small, powerful tabletop XRF.

Epsilon 1 is a fully integrated energy-dispersive XRF analysis device consisting of a spectrometer, built-in computer, touchscreen, and analytical software. Operating with the latest advanced excitation and detection technologies, Epsilon 1 boasts the best performance in its class of low-cost benchtop devices. Epsilon 1 can generate high-speed, cost-effective, and highly accurate data by minimizing reliance on operators and sample preparation. As a result, the total maintenance costs are significantly reduced compared to other analytical techniques such as AAS, ICP, and wet chemical methods, which are expensive and require specialized skilled operators.

  • X-ray fluorescence analyzer
  • X-ray analysis equipment

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Energy-dispersive X-ray fluorescence analyzer dedicated to low concentration sulfur/chlorine analysis in fuels.

Energy-dispersive X-ray fluorescence analyzer dedicated to low concentration sulfur/chlorine analysis in fuels.

A dedicated low concentration sulfur/chlorine analysis type has been added to the tabletop fluorescent X-ray analysis device. Compliant with ISO 13032 Epsilon 1.

The tabletop fluorescent X-ray analysis device Epsilon 1 has added a dedicated type for low concentration sulfur/chlorine analysis in fuels. This model complies with the international standard ISO13032 for sulfur and the Japanese Industrial Standard JIS K2541-4. It accurately measures sulfur in automotive fuels to chlorine content in crude oil. It is fully plug-and-play, making it widely usable from quality control to manufacturing sites. 【High Performance & Low Running Costs】 - Adopts high-output X-ray tubes and detection systems specifically designed for S/C l → Achieves trace analysis of sulfur (S) and chlorine (C l) - Low running cost (approximately 140 yen per use) → Maintains the low running cost of EDX 【No Helium Gas Required & Easy Measurement in Atmospheric Conditions】 - High-sensitivity light source and detector eliminate the need for liquid nitrogen or vacuum systems - Integrated software and device make it easy to install in various locations - Pre-calibrated for low sulfur measurement in accordance with ISO13032 - Pre-calibrated for chlorine analysis - Sample adjustment tools, liquid cups, and standard samples are included with the product.

  • X-ray fluorescence analyzer
  • X-ray analysis equipment

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Silicon Drift Detector System

Silicon Drift Detector System

Energy-dispersive X-ray detector and counting circuit that achieve high resolution and high counting rate! X-ray diffraction and fluorescence X-ray analysis.

A comprehensive system of energy-dispersive X-ray detectors and counting circuits that achieves high energy resolution and high counting rates by minimizing thermal noise through the cooling of Peltier elements and maximizing charge collection.

  • Analytical Equipment and Devices
  • X-ray analysis equipment

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Fluorescent X-ray analysis device "OURSTEX160"

Fluorescent X-ray analysis device "OURSTEX160"

Shall we analyze the harmful heavy metals and hazardous elements from industrial waste in the soil now to avoid risks?

The "OURSTEX160" is an optimal fluorescent X-ray analysis device for analyzing harmful heavy metals in soil and environmental samples of industrial waste. In Miyagi Prefecture, a subsidy system has been established to support businesses that equip facilities aimed at promoting the reduction, reuse, and recycling (3R) of industrial waste. Recently, a company conducting analysis using this product has been certified as eligible for the subsidy. 【Features】 ■ Compact and lightweight device ■ Easy and rapid measurement ■ Energy-efficient device ■ Environmentally friendly analysis method ■ Capable of high-resolution and high-sensitivity analysis For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices
  • X-ray fluorescence analyzer
  • X-ray inspection equipment
  • X-ray analysis equipment

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Fluorescent X-ray analysis device "OURSTEX160RoHS"

Fluorescent X-ray analysis device "OURSTEX160RoHS"

WEEE/RoHS Directive Compliance - Fluorescent X-ray Analyzer OURSTEX160RoHS

The RoHS directive, implemented in the EU (European Union) in July 2006, restricts the use of six specific hazardous substances (lead, mercury, cadmium, hexavalent chromium, PBB, and PBDE) in electrical and electronic equipment. OURSTEX160RoHS allows for easy measurement of these hazardous substances in a short amount of time. Additionally, its compact and lightweight design makes it ideal for on-site analysis in the field.

  • Analytical Equipment and Devices
  • X-ray fluorescence analyzer
  • X-ray inspection equipment
  • X-ray analysis equipment

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Fluorescent X-ray analysis device "OURSTEX140"

Fluorescent X-ray analysis device "OURSTEX140"

It is a fluorescence X-ray analysis device optimal for high-precision and trace analysis.

High-precision trace analysis - X-ray fluorescence analysis device

  • Analytical Equipment and Devices
  • X-ray fluorescence analyzer
  • X-ray inspection equipment
  • X-ray analysis equipment

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Portable Total Reflection Fluorescence X-ray Analysis Device "OURSTEX200TX"

Portable Total Reflection Fluorescence X-ray Analysis Device "OURSTEX200TX"

High sensitivity comparable to ICP and atomic absorption devices! Total reflection fluorescence X-ray analysis equipment capable of ultra-trace analysis.

The portable total reflection fluorescent X-ray analysis device "OURSTEX200TX" is a lightweight, high-sensitivity, and low-cost total reflection fluorescent X-ray device priced under 10 million yen! It was developed by Professor Jun Kawai from the Graduate School of Engineering at Kyoto University and commercialized by Awazuteku Co., Ltd. 【Features】 ● Ideal for ultra-trace analysis! ● Total weight of just 8 kg! ● Capable of high-sensitivity analysis comparable to ICP and atomic absorption devices. ● Equipped with an SDD (Silicon Drift Detector)! 【Examples of Applications】 ◎ Testing of well water and rivers ◎ Leachate analysis from soil and toys ◎ On-site analysis in the fields of food, pharmaceuticals, and forensic science ◎ Component analysis of hair and airborne particles 【For more details, please download the catalog or feel free to contact us】

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Example of harmful element analysis in soil

Example of harmful element analysis in soil

I will introduce examples of harmful element analysis in soil.

The Soil Contamination Countermeasures Act mandates soil contamination surveys for land that may be contaminated. The fluorescent X-ray analysis device "OURSTEX160" allows for rapid analysis of harmful elements on-site. For more details, please contact us or refer to the catalog.

  • X-ray fluorescence analyzer
  • Analytical Equipment and Devices
  • Soil testing
  • X-ray analysis equipment

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Example of basicity management of molten slag

Example of basicity management of molten slag

I will introduce an example of managing the basicity of molten slag.

As an effective utilization method for incineration ash, recyclable ash melting slag is produced and used in various fields. The fluorescent X-ray analysis device "OURSTEX160" allows for easy quality control of the slag through the analysis of its basicity (CaO/SiO2). For more details, please contact us or refer to the catalog.

  • X-ray fluorescence analyzer
  • X-ray inspection equipment
  • Analytical Equipment and Devices
  • X-ray analysis equipment

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Example of concrete salt damage investigation and analysis

Example of concrete salt damage investigation and analysis

I will introduce an example of concrete salt damage investigation and analysis.

In recent years, the deterioration of concrete structures due to salt damage caused by airborne salt and the application of anti-freezing agents has become a significant social issue. With the fluorescent X-ray analysis device "OURSTEX101FA" from Awaz Tech, it has become possible to easily and quickly measure the amount of chlorides in concrete on-site for the first time. For more details, please contact us or refer to the catalog.

  • X-ray fluorescence analyzer
  • X-ray inspection equipment
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  • X-ray analysis equipment

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Analysis of soil, gravel, and crushed stone

Analysis of soil, gravel, and crushed stone

This introduces examples of analysis for soil, gravel, and crushed stone.

The most important aspect of environmental issues is the recycling of waste to reclaim resources, but it is necessary to scientifically analyze the presence of harmful substances at the entry point and assess safety. The fluorescent X-ray analysis device "OURSTEX160" allows for easy on-site analysis of soil, gravel, and crushed stone in quarries and similar locations. For more details, please contact us or refer to the catalog.

  • X-ray fluorescence analyzer
  • Environmental Test Equipment
  • Analytical Equipment and Devices
  • X-ray analysis equipment

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Comprehensive catalog of the "OURSTEX" series of X-ray fluorescence analysis devices.

Comprehensive catalog of the "OURSTEX" series of X-ray fluorescence analysis devices.

A wide range of compact, lightweight, and high-performance non-destructive analysis devices are featured! They are ideal for soil contamination surveys, inline analysis, and concrete salt damage investigations.

This is a comprehensive catalog of the fluorescent X-ray analysis device series "OURSTEX," which provides rapid, non-destructive elemental analysis on-site. It is currently used in various fields such as soil analysis, RoHS analysis, and product quality control. Our company is dedicated to creating compact, lightweight, and high-performance devices utilizing X-ray elemental technology. We collaborate with our customers to create products tailored to their needs. [Contents] ■ OURSTEX 100FA … Ideal for portable, on-site analysis ■ OURSTEX 101FA … Ideal for investigating salt damage in concrete ■ OURSTEX 170 … A compact and lightweight analysis device *For more details, please download the PDF or contact us.

  • X-ray fluorescence analyzer
  • X-ray analysis equipment

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Energy Dispersive Fluorescence X-ray Analyzer "OURSTEX180"

Energy Dispersive Fluorescence X-ray Analyzer "OURSTEX180"

Gathering our proprietary elemental technologies! Capable of a wide range of high-sensitivity measurements from light elements to medium and heavy elements!

The "OURSTEX180" is an energy-dispersive X-ray fluorescence analyzer equipped with a monochromator dedicated to L lines. It enables a wide range of high-sensitivity measurements, from light elements to medium and heavy element analysis. It is suitable for analyzing S and Cl in oil, light element analysis in cement and incineration ash, trace light element analysis on films, and film thickness analysis. 【Features】 ■ Compact and highly portable ■ Equipped with a double-curved monochromator dedicated to L lines ■ Improved detection sensitivity for light elements through Pd-Lα monochromatic excitation ■ Equipped with a high-performance SDD detector and high counting rate compatible DSP ■ Analysis of medium and heavy elements is also possible with filter functionality *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray fluorescence analyzer
  • Analytical Equipment and Devices
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Handheld X-ray Fluorescence Analyzer "VoXER"

Handheld X-ray Fluorescence Analyzer "VoXER"

Domestic handheld fluorescent X-ray device! It determines alloys based on the results of component analysis.

"VoXER" is a handheld fluorescent X-ray device suitable for distinguishing between different types of metals. It can analyze without being limited to specific target objects. The X-ray source generates X-rays through friction rather than the conventional X-ray tube method. This product is produced in Japan and has a well-established maintenance system. It can be used with confidence even by those who have trouble with maintenance for overseas products. Please feel free to contact us when you need assistance. 【Features】 ■ Ideal for distinguishing between different types of metals ■ Battery-operated for easy analysis anywhere ■ Generates X-rays through wear instead of conventional X-ray tubes ■ Equipped with an SDD detector *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray fluorescence analyzer
  • X-ray analysis equipment

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Portable X-ray Fluorescence Analyzer 'OURSTEX 170IIS'

Portable X-ray Fluorescence Analyzer 'OURSTEX 170IIS'

Equipping window materials with graphene! Improved analysis sensitivity in the light element region compared to conventional Be.

The "OURSTEX 170IIS" is a portable fluorescent X-ray analysis device that serves as the successor model to the "OURSTEX 170" product line. It inherits the portability and sample chamber size from the "170 model," while adopting a new detector system that improves the detection sensitivity for light elements. As a high-precision, easy-to-operate, and compact fluorescent X-ray analysis device, the "170IIS" is designed to better meet the elemental analysis needs in the field. 【Features】 ■ Compact and portable device size ■ Operates on AC100V only, with energy-saving design ■ Eliminates excessive features to achieve a low price ■ Equipped with a new detector system ■ Utilizes a graphene window SDD detector *For more details, please download the PDF or feel free to contact us.

  • X-ray fluorescence analyzer
  • X-ray analysis equipment

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Detection of trace elements by EPMA.

Detection of trace elements by EPMA.

Detection sensitivity is excellent! It is particularly superior in quantitative analysis of trace components and map analysis.

EPMA analysis has good energy resolution and detection sensitivity, making it particularly excellent for quantitative analysis of trace components and map analysis. In a case where a defect occurred in the Au-1st bonding within the package, EDX analysis and EPMA analysis were conducted to identify and confirm the distribution of the corrosive substances. Since EPMA has superior resolution, detection limits, and P/B (peak-to-background) ratios compared to EDX, the distribution of trace Cl could be clearly understood. 【Equipment Specifications】 ■ Manufactured by JEOL Ltd. Jeol-8200 ■ Analysis method: Wavelength dispersive X-ray analysis (WDX) ■ Analyzable elements: B to U ■ Energy resolution: 20 eV (EDX is approximately 130 eV) ■ Detection limit: 0.01% and above ■ Maximum sample dimensions: 100×100 mm *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis
  • X-ray analysis equipment

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[Analysis Case] Evaluation of Gold Thin Film Adhesion on Wafer by XRF

[Analysis Case] Evaluation of Gold Thin Film Adhesion on Wafer by XRF

Comparison of the amount of thin film components adhered between samples.

In fluorescent X-ray analysis (XRF), a simple evaluation of elemental distribution is possible. In this case study, we used a deposition device to create films of arbitrary amounts of Au on 4-inch Si wafers A and B as samples, and compared the distribution and total amount of Au. The results of the surface analysis confirmed the distribution state of Au (Figures 1-4). Additionally, by comparing the adhesion amounts based on the Au intensity from the XRF spectra obtained from each pixel, we confirmed that wafer B had more Au than wafer A (Figure 5).

  • Contract Analysis
  • X-ray analysis equipment

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[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.

[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.

Visualization of film thickness distribution through multi-point mapping measurement.

In fluorescent X-ray analysis (XRF), it is possible to easily evaluate element distribution and film thickness. In this case study, we will introduce an example of evaluating the thickness distribution of an Au film on a 4-inch Si wafer through multi-point mapping measurements. By performing multi-point mapping, we can calculate the Au film thickness using the FP (Fundamental Parameter) method from the XRF spectra at each point, allowing for the evaluation of thickness distribution based on the measurement coordinates.

  • Contract Analysis
  • X-ray analysis equipment

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Announcement of the Start of Non-Destructive Testing Services from April 2018

Announcement of the Start of Non-Destructive Testing Services from April 2018

We have assembled equipment that is strong in the analysis of organic materials such as resin and carbon composites.

On April 2, 2018, MST will introduce the latest processing and analysis equipment and begin offering non-destructive analysis services. We will provide analysis services across a wide range of fields, including product development and quality control for electronic devices, pharmaceuticals, and food. Non-destructive analysis is a technology that visualizes the internal state of a product without destroying it. Until now, MST has primarily offered contract services based on destructive analysis methods such as electron microscopy and mass spectrometry. However, there has been an increasing customer demand for observing electronic devices without destruction in recent years. Additionally, there has been a growing need in other fields as well, such as confirming the shapes of pharmaceutical and medical device components, observing the distribution of constituent materials within food, and checking for the presence of cavities. With the introduction of the latest processing and analysis equipment, MST is now able to conduct non-destructive analysis. We will provide analysis services on a contract basis.

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  • Contract measurement
  • Composite Materials
  • X-ray analysis equipment

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Observation of structural changes in metallic materials through tensile testing using in situ X-ray CT.

Observation of structural changes in metallic materials through tensile testing using in situ X-ray CT.

Capable of evaluating three-dimensional structural changes according to tensile stress.

In situ X-ray CT measurements allow for internal structure analysis under conditions where a load (tension or compression) is applied to the sample. In this document, in situ X-ray CT measurements were conducted using an aluminum plate as the sample, both in its normal state and in an extended state. We calculated the tensile stress applied to the sample and monitored the internal structural changes under each stress condition. By combining in situ X-ray CT measurements with image analysis technology, it is possible to evaluate under actual usage conditions, which was previously difficult, and assess the impact of stress on the product.

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  • Contract measurement
  • Contract Inspection
  • X-ray analysis equipment

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Development in the field of information

Development in the field of information

Development of control and communication for digital products represented by mobile phones, printers, and digital cameras, as well as development of control systems for automobiles and factory automation equipment.

We provide a comprehensive range of services related to IT business, from application development and network and server construction to post-implementation support.

  • Circuit board design and manufacturing
  • X-ray analysis equipment

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